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Introduction
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Starting scenario |
Project Description
The "Defect Prevention and Test Sampling Strategy" Process
Improvement Experiment (PIE) was established to investigate patterns of
defects that commonly occur in the Software Development Process.
The Goal of the PIE was to define and implement techniques
to reduce the total number of defects in the Development Life-Cycle and
to prevent certain classes of defects from recurring.
It is well known that correcting defects in later stages of the Development Life-cycle is more complicated, expensive and time-consuming than correcting them in earlier stages. Preferable even to early detection, is the avoidance of defects altogether - the Defect Prevention method. Defect Prevention is therefore the best way to optimize the development process costs and to shorten the development cycle time.
The objective of the experiment was to define and implement Defect Prevention methods and techniques, to be used in the different phases of the Development Life-cycle, and once the quantity of defects is reduced, determine a Strategy for decreasing the Testing efforts needed for development projects.
The PIE has produced a better understanding of common
defect types, suggested and implemented solutions to avoid them, and established
a mechanism to investigate new / remaining defects with the goal of eliminating
them.
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Introduction
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Starting scenario |